Difference between revisions of "IRPS 2020"
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(Created page with "{{Event |Acronym=IRPS 2020 |Title=2020 IEEE International Reliability Physics Symposium |Series=IRPS |Type=Conference |Start date=2020/04/28 |End date=2020/05/30 |Homepage=htt...") |
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|State=Texas | |State=Texas | ||
|Country=Online | |Country=Online | ||
| + | |has general chair=Gaudenzio Meneghesso | ||
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Sollte eigentlich vom 29.03.2020-02.04.2020 in Dallas, Texas, USA stattfinden, wurde aufgrund der COVID-19 Pandemie aber zeitlich verschoben und als Online-Konferenz abgehalten. | Sollte eigentlich vom 29.03.2020-02.04.2020 in Dallas, Texas, USA stattfinden, wurde aufgrund der COVID-19 Pandemie aber zeitlich verschoben und als Online-Konferenz abgehalten. | ||
| + | |||
| + | ==Topics of Interest== | ||
| + | IRPS 2021 is soliciting increased participation in the following special focus topic areas. | ||
| + | * Circuit Reliability and Aging – RAS, self-healing, aging aware designs, design tools | ||
| + | * Emerging memory / Neuromorphic Computing– Reliability for PCM, MRAM, RRAM, ferroelectrics | ||
| + | * Reliability of RF/mmW/5G Devices – CMOS, SiGe BiCMOS, SOI, GaAs, GaN | ||
| + | |||
| + | Papers in the following areas are requested. | ||
| + | |||
| + | Circuits, Products, and Systems | ||
| + | * Circuit Reliability and Aging | ||
| + | * IC Product Reliability | ||
| + | * System Electronics Reliability | ||
| + | * Soft Errors | ||
| + | * ESD and Latchup | ||
| + | * Packaging and 2.5D/3D Assembly | ||
| + | * Reliability Testing | ||
| + | * Silicon Photonics | ||
| + | * RF/mmW/5G | ||
| + | |||
| + | Materials, Processing, and Devices | ||
| + | * Transistors | ||
| + | * Gate/MOL Dielectrics | ||
| + | * Beyond CMOS Devices | ||
| + | * Neuromorphic Computing Reliability | ||
| + | * Wide-Bandgap Semiconductors | ||
| + | * Compound and Optoelectronic Devices | ||
| + | * Metallization/BEOL Reliability | ||
| + | * Process Integration | ||
| + | * Failure Analysis | ||
| + | * Memory Reliability | ||
| + | * Photovoltaics | ||
| + | * MEMS | ||
Revision as of 12:54, 15 June 2020
| IRPS 2020 | |
|---|---|
2020 IEEE International Reliability Physics Symposium
| |
| Event in series | IRPS |
| Dates | 2020/04/28 (iCal) - 2020/05/30 |
| Homepage: | https://irps.org/ |
| Location | |
| Location: | Dallas, Texas, Online |
| Committees | |
| General chairs: | Gaudenzio Meneghesso |
| Table of Contents | |
Sollte eigentlich vom 29.03.2020-02.04.2020 in Dallas, Texas, USA stattfinden, wurde aufgrund der COVID-19 Pandemie aber zeitlich verschoben und als Online-Konferenz abgehalten.
Topics of Interest
IRPS 2021 is soliciting increased participation in the following special focus topic areas.
- Circuit Reliability and Aging – RAS, self-healing, aging aware designs, design tools
- Emerging memory / Neuromorphic Computing– Reliability for PCM, MRAM, RRAM, ferroelectrics
- Reliability of RF/mmW/5G Devices – CMOS, SiGe BiCMOS, SOI, GaAs, GaN
Papers in the following areas are requested.
Circuits, Products, and Systems
- Circuit Reliability and Aging
- IC Product Reliability
- System Electronics Reliability
- Soft Errors
- ESD and Latchup
- Packaging and 2.5D/3D Assembly
- Reliability Testing
- Silicon Photonics
- RF/mmW/5G
Materials, Processing, and Devices
- Transistors
- Gate/MOL Dielectrics
- Beyond CMOS Devices
- Neuromorphic Computing Reliability
- Wide-Bandgap Semiconductors
- Compound and Optoelectronic Devices
- Metallization/BEOL Reliability
- Process Integration
- Failure Analysis
- Memory Reliability
- Photovoltaics
- MEMS