Difference between revisions of "ICMTS 2019"
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(Created page with "{{Event |Acronym=ICMTS 2019 |Title=32nd IEEE International Conference on Microelectronic Test Structures |Ordinal=32 |Series=ICMTS |Type=Conference |Field=Uncategorized |Start...") |
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| − | |has Proceedings Link=https://ieeexplore.ieee.org/ | + | |Accepted papers=38 |
| + | |has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8726168 | ||
|ISBN=978-1-7281-1466-8 | |ISBN=978-1-7281-1466-8 | ||
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Revision as of 16:12, 8 July 2021
| ICMTS 2019 | |
|---|---|
32nd IEEE International Conference on Microelectronic Test Structures
| |
| Ordinal | 32 |
| Event in series | ICMTS |
| Dates | 2019/03/18 (iCal) - 2019/03/21 |
| Presence | presence |
| Location | |
| Location: | Kitakyushu, Japan |
| Table of Contents | |