Difference between revisions of "ICMTS 2018"
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(Created page with "{{Event |Acronym=ICMTS 2018 |Title=IEEE International Conference on Microelectronic Test Structures |Ordinal=31 |Series=ICMTS |Type=Conference |Field=Uncategorized |Start date...") |
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|gndId=1169681158 | |gndId=1169681158 | ||
|City=Austin | |City=Austin | ||
| + | |State=Texas | ||
|Country=USA | |Country=USA | ||
|presence=presence | |presence=presence | ||
| − | | | + | |has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 |
|has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | |has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | ||
|ISBN=978-1-5386-5069-1 | |ISBN=978-1-5386-5069-1 | ||
}} | }} | ||
Revision as of 16:21, 8 July 2021
| ICMTS 2018 | |
|---|---|
IEEE International Conference on Microelectronic Test Structures
| |
| Ordinal | 31 |
| Event in series | ICMTS |
| Dates | 2018/03/19 (iCal) - 2018/03/22 |
| Presence | presence |
| Location | |
| Location: | Austin, Texas, USA |
| Table of Contents | |
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