Difference between revisions of "IEEE BTW"
Jump to navigation
Jump to search
(Created page with "{{Event series |Acronym=IEEE BTW |Title=International Board Test Workshop |Field=Board Test }}") |
Tim Holzheim (talk | contribs) (Added page provenance(#264) and contribution type(#271)) |
||
Line 3: | Line 3: | ||
|Title=International Board Test Workshop | |Title=International Board Test Workshop | ||
|Field=Board Test | |Field=Board Test | ||
+ | |pageCreator=Wf | ||
+ | |contributionType=1 | ||
}} | }} |
Latest revision as of 21:16, 1 April 2022
IEEE BTW 



IEEE BTW | |
---|---|
International Board Test Workshop
| |
Categories: Board Test
| |
Avg. acceptance rate: | 0 |
Avg. acceptance rate (last 5 years): | 0 |
Table of Contents | |
International Board Test Workshop (IEEE BTW) has an average acceptance rate of 0% (last 5 years 0%).
Events
There are 1 events of the series IEEE BTW known to this wiki: IEEE BTW 2008
Ordinal | Year | From | To | City | Country | presence | Homepage | TibKatId | GND | dblp | WikiCFP | Wikidata | |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|
IEEE BTW 2008 | 7 | 2008 | Sep 16 | Sep 18 | Fort Collins | USA | presence | http://www.molesystems.com/BTW08 | 3248 |
Submission/Acceptance
Locations