Difference between revisions of "ICMTS 2018"

Latest revision as of 20:19, 1 April 2022

ICMTS 2018
IEEE International Conference on Microelectronic Test Structures
Ordinal	31
Event in series	ICMTS
Dates	2018/03/19 (iCal) - 2018/03/22
Presence	presence
Location
Location:	Austin, Texas, USA
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Table of Contents

@@ Line 10: / Line 10: @@
 |gndId=1169681158
 |City=Austin
+|State=Texas
 |Country=USA
 |presence=presence
-|Accepted papers=38
+|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243
 |has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243
 |ISBN=978-1-5386-5069-1
+|pageCreator=Saskia.Ernert
+|pageEditor=Saskia.Ernert
+|contributionType=1
 }}