Difference between revisions of "ICMTS 2009"

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{{Event
 
{{Event
| Acronym = ICMTS 2009
+
|Acronym=ICMTS 2009
| Title = IEEE International Conference on Microelectronic Test Structures
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|Title=IEEE International Conference on Microelectronic Test Structures
| Type = Conference
+
|Series=ICMTS
| Series =  
+
|Type=Conference
| Field = Uncategorized
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|Field=Uncategorized
| Homepage = www.see.ed.ac.uk/ICMTS
+
|Start date=2009/03/30
| Start date = Mar 30, 2009
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|End date=2009/04/02
| End date =  Apr 2, 2009
+
|Submission deadline=2008/09/15
| City= Oxnard
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|Homepage=www.see.ed.ac.uk/ICMTS
| State = CA
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|City=Oxnard
| Country = USA
+
|State=CA
| Abstract deadline =  
+
|Country=USA
| Submission deadline = Sep 15, 2008
+
|presence=presence
| Notification =  
+
|wikicfpId=2859
| Camera ready =  
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|pageCreator=127.0.0.1
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|pageEditor=Saskia.Ernert
 +
|contributionType=1
 
}}
 
}}
 
 
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2859&amp;copyownerid=2 WikiCFP]
 
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2859&amp;copyownerid=2 WikiCFP]

Latest revision as of 20:46, 1 April 2022

ICMTS 2009
IEEE International Conference on Microelectronic Test Structures
Event in series ICMTS
Dates 2009/03/30 (iCal) - 2009/04/02
Presence presence
Homepage: www.see.ed.ac.uk/ICMTS
Location
Location: Oxnard, CA, USA
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Important dates
Submissions: 2008/09/15
Table of Contents



This CfP was obtained from WikiCFP