Difference between revisions of "ICMTS 2020"

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|gndId=1217717676
 
|gndId=1217717676
 
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=9104792
 
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=9104792
|ISBN=978-1-7281-4008-7
 
 
|Acronym=ICMTS 2020
 
|Acronym=ICMTS 2020
|End date=2020/03/18
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|End date=2020-03-18
 
|Series=ICMTS
 
|Series=ICMTS
 
|presence=online
 
|presence=online
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|State=GB/SCT
 
|State=GB/SCT
 
|City =GB/SCT/Edinburgh
 
|City =GB/SCT/Edinburgh
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|Year =2020
 
|Homepage=https://www.eng.ed.ac.uk/
 
|Homepage=https://www.eng.ed.ac.uk/
 
|Ordinal=33
 
|Ordinal=33
|Start date=2020/03/04
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|Start date=2020-03-04
|Title=33rd IEEE International Conference on Microelectronic Test Structures}}
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|Title=33rd IEEE International Conference on Microelectronic Test Structures
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|ISBN =978-1-7281-4008-7
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}}

Latest revision as of 03:03, 7 December 2021


Event Rating

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List of all ratings can be found at ICMTS 2020/rating

ICMTS 2020
33rd IEEE International Conference on Microelectronic Test Structures
Ordinal 33
Event in series ICMTS
Dates 2020-03-04 (iCal) - 2020-03-18
Presence online
Homepage: https://www.eng.ed.ac.uk/
Location
Location: GB/SCT/Edinburgh, GB/SCT, GB
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Important dates
Submissions: 2021/10/29
Table of Contents