Difference between revisions of "ICMTS 2020"

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{{Event
 
{{Event
|Acronym=ICMTS 2020
 
|Title=33rd IEEE International Conference on Microelectronic Test Structures
 
|Ordinal=33
 
|Series=ICMTS
 
|Type=Conference
 
 
|Field=Uncategorized
 
|Field=Uncategorized
|Start date=2020/03/04
 
|End date=2020/03/18
 
 
|Submission deadline=2021/10/29
 
|Submission deadline=2021/10/29
|Homepage=https://www.eng.ed.ac.uk/
 
 
|gndId=1217717676
 
|gndId=1217717676
|City=Edinburgh
+
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=9104792
|Country=Online
+
|Acronym=ICMTS 2020
 +
|End date=2020-03-18
 +
|Series=ICMTS
 
|presence=online
 
|presence=online
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=9104792
+
|Type =Conference
|ISBN=978-1-7281-4008-7
+
|Country=GB
|State=GB/SCT}}
+
|State=GB/SCT
 +
|City =GB/SCT/Edinburgh
 +
|Year =2020
 +
|Homepage=https://www.eng.ed.ac.uk/
 +
|Ordinal=33
 +
|Start date=2020-03-04
 +
|Title=33rd IEEE International Conference on Microelectronic Test Structures
 +
|ISBN =978-1-7281-4008-7
 +
}}

Latest revision as of 03:03, 7 December 2021


Event Rating

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List of all ratings can be found at ICMTS 2020/rating

ICMTS 2020
33rd IEEE International Conference on Microelectronic Test Structures
Ordinal 33
Event in series ICMTS
Dates 2020-03-04 (iCal) - 2020-03-18
Presence online
Homepage: https://www.eng.ed.ac.uk/
Location
Location: GB/SCT/Edinburgh, GB/SCT, GB
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Important dates
Submissions: 2021/10/29
Table of Contents