Difference between revisions of "ICMTS 2020"

From OPENRESEARCH fixed Wiki
Jump to navigation Jump to search
(modified through wikirestore by orapi)
(modified through wikirestore by orapi)
 
Line 4: Line 4:
 
|gndId=1217717676
 
|gndId=1217717676
 
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=9104792
 
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=9104792
|ISBN=978-1-7281-4008-7
 
 
|Acronym=ICMTS 2020
 
|Acronym=ICMTS 2020
 
|End date=2020-03-18
 
|End date=2020-03-18
Line 18: Line 17:
 
|Start date=2020-03-04
 
|Start date=2020-03-04
 
|Title=33rd IEEE International Conference on Microelectronic Test Structures
 
|Title=33rd IEEE International Conference on Microelectronic Test Structures
 +
|ISBN =978-1-7281-4008-7
 
}}
 
}}

Latest revision as of 03:03, 7 December 2021


Event Rating

median worst
Pain1.svg Pain5.svg

List of all ratings can be found at ICMTS 2020/rating

ICMTS 2020
33rd IEEE International Conference on Microelectronic Test Structures
Ordinal 33
Event in series ICMTS
Dates 2020-03-04 (iCal) - 2020-03-18
Presence online
Homepage: https://www.eng.ed.ac.uk/
Location
Location: GB/SCT/Edinburgh, GB/SCT, GB
Loading map...

Important dates
Submissions: 2021/10/29
Table of Contents