Difference between revisions of "ICMTS 2019"

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|gndId=1194495664
 
|gndId=1194495664
 
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8726168
 
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8726168
|ISBN=978-1-7281-1466-8
 
 
|Acronym=ICMTS 2019
 
|Acronym=ICMTS 2019
|End date=2019/03/21
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|End date=2019-03-21
 
|Series=ICMTS
 
|Series=ICMTS
 
|presence=presence
 
|presence=presence
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|State=JP/40
 
|State=JP/40
 
|City =JP/40/Kitakyūshū
 
|City =JP/40/Kitakyūshū
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|Year =2019
 
|Ordinal=32
 
|Ordinal=32
|Start date=2019/03/18
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|Start date=2019-03-18
 
|Title=32nd IEEE International Conference on Microelectronic Test Structures
 
|Title=32nd IEEE International Conference on Microelectronic Test Structures
|Accepted papers=38}}
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|Accepted papers=38
 +
|ISBN =978-1-7281-1466-8
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}}

Latest revision as of 03:06, 7 December 2021


Event Rating

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List of all ratings can be found at ICMTS 2019/rating

ICMTS 2019
32nd IEEE International Conference on Microelectronic Test Structures
Ordinal 32
Event in series ICMTS
Dates 2019-03-18 (iCal) - 2019-03-21
Presence presence
Location
Location: JP/40/Kitakyūshū, JP/40, JP
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