Difference between revisions of "ICMTS 2019"

Event Rating

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ICMTS 2019
32nd IEEE International Conference on Microelectronic Test Structures
Ordinal	32
Event in series	ICMTS
Dates	2019-03-18 (iCal) - 2019-03-21
Presence	presence
Location
Location:	JP/40/Kitakyūshū, JP/40, JP
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AcronymThis property is of the datatype Text and it is being used to provide the acronym of an academic event or an event series.It is a recommended property when describing an academic event or event series and it is not needed for the DOI registration process via DataCite.

ICMTS 2019 +

End dateThis property is of the datatype Date and it is being used to provide the end date of an academic event or a project.This property is aligned with icaltzd:dtend.It is a mandatory property when describing an academic event and it is needed for the DOI registration process via DataCite.

March 21, 2019 +

Event in seriesThe property Event in series, of the datatype Page, is used to state that an academic event is part of a specific academic event series. Although this property is not needed for the DOI registration process via DataCite its usage is strongly recommended.

ICMTS +

Event presence

presence +

Event typeThis property of the datatype Text is used to specify the format of an academic event. The use of this property is recommended. It is necessary for the DOI registration process via DataCite.

Conference +

GND-IDThis property of the datatype External identifier is used to provide the identifier with which an entity is indexed in the Integrated_Authority_File (GND). Its external formatter URI is http://d-nb.info/gnd/$1.In Open Research it is mostly used to identify an academic event or event series within the GND. The use of this property is optional.It is not necessary for the DOI registration process via DataCite.

1194495664 +

Has location cityThe property Has location city can be used to specify the city where a street, building, event, etc. is located in.It is of the datatype Page and a special case of the Property:Located in. Other properties for specifying locations are: property:Has location country, property:Has location state and property:Has location address.When specifying the city in which an academic event takes or took place, using this property is not needed for the DOI registration process via DataCite but strongly recommended.

JP/40/Kitakyūshū +

Has location countryThe property Has location country is used to describe the country where something is located in.It is of the datatype Page and a special case of the Property:Located in. Other properties for specifying locations are: property:Has location city, property:Has location state and property:Has location address.When specifying the country in which an academic event takes or took place, using this property is not needed for the DOI registration process via DataCite but strongly recommended.

JP +

Has year

2019 +

IsA

Event +

OrdinalThis property of the datatype Number represents the ordinal number of an event within an event series. Thereby it informs about the age of an event series. This property is not needed for the DOI registration process via DataCite and is optional.

32 +

Start dateThis property is of the datatype Date and it is being used to provide the start date of an academic event or a project.This property is aligned with icaltzd:dtstart. It is a mandatory property when describing an academic event and it is needed for the DOI registration process via DataCite.

March 18, 2019 +

@@ Line 1: / Line 1: @@
 {{Event
+|Field=Uncategorized
+|gndId=1194495664
+|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8726168
 |Acronym=ICMTS 2019
-|Title=32nd IEEE International Conference on Microelectronic Test Structures
+|End date=2019-03-21
-|Ordinal=32
 |Series=ICMTS
-|Type=Conference
-|Field=Uncategorized
-|Start date=2019/03/18
-|End date=2019/03/21
-|gndId=1194495664
-|City=Kitakyushu
-|Country=Japan
 |presence=presence
+|Type =Conference
+|Country=JP
+|State=JP/40
+|City =JP/40/Kitakyūshū
+|Year =2019
+|Ordinal=32
+|Start date=2019-03-18
+|Title=32nd IEEE International Conference on Microelectronic Test Structures
 |Accepted papers=38
-|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8726168
+|ISBN =978-1-7281-1466-8
-|ISBN=978-1-7281-1466-8
+}}
-|State=JP/40}}

Difference between revisions of "ICMTS 2019"

Latest revision as of 03:06, 7 December 2021

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