Difference between revisions of "ICMTS 2019"
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|gndId=1194495664 | |gndId=1194495664 | ||
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8726168 | |has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8726168 | ||
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|Acronym=ICMTS 2019 | |Acronym=ICMTS 2019 | ||
|End date=2019-03-21 | |End date=2019-03-21 | ||
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|Start date=2019-03-18 | |Start date=2019-03-18 | ||
|Title=32nd IEEE International Conference on Microelectronic Test Structures | |Title=32nd IEEE International Conference on Microelectronic Test Structures | ||
− | |Accepted papers=38}} | + | |Accepted papers=38 |
+ | |ISBN =978-1-7281-1466-8 | ||
+ | }} |
Latest revision as of 03:06, 7 December 2021
Event Rating
median | worst |
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List of all ratings can be found at ICMTS 2019/rating
ICMTS 2019 | |
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32nd IEEE International Conference on Microelectronic Test Structures
| |
Ordinal | 32 |
Event in series | ICMTS |
Dates | 2019-03-18 (iCal) - 2019-03-21 |
Presence | presence |
Location | |
Location: | JP/40/Kitakyūshū, JP/40, JP |
Table of Contents | |