Difference between revisions of "ICMTS 2019"

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(modified through wikirestore by orapi)
(modified through wikirestore by orapi)
 
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|gndId=1194495664
 
|gndId=1194495664
 
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8726168
 
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8726168
|ISBN=978-1-7281-1466-8
 
 
|Acronym=ICMTS 2019
 
|Acronym=ICMTS 2019
 
|End date=2019-03-21
 
|End date=2019-03-21
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|Title=32nd IEEE International Conference on Microelectronic Test Structures
 
|Title=32nd IEEE International Conference on Microelectronic Test Structures
 
|Accepted papers=38
 
|Accepted papers=38
 +
|ISBN =978-1-7281-1466-8
 
}}
 
}}

Latest revision as of 03:06, 7 December 2021


Event Rating

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List of all ratings can be found at ICMTS 2019/rating

ICMTS 2019
32nd IEEE International Conference on Microelectronic Test Structures
Ordinal 32
Event in series ICMTS
Dates 2019-03-18 (iCal) - 2019-03-21
Presence presence
Location
Location: JP/40/Kitakyūshū, JP/40, JP
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