Difference between revisions of "SEMI-THERM 2008"

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(modified through wikirestore by Th)
 
(modified through wikirestore by Th)
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{{Event
 
{{Event
 +
| Acronym = SEMI-THERM 2008
 +
| Title = IEEE/CPMT 24th Semiconductor Thermal Measurement, Modeling & Management Symposium
 +
| Type = Conference
 +
| Series =
 
  | Field = Manufacturing
 
  | Field = Manufacturing
 +
| Homepage = www.semi-therm.org
 +
| Start date = Mar 16, 2008
 +
| End date =  Mar 20, 2008
 +
| City= San Jose
 +
| State =  CA
 +
| Country =  USA
 
  | Abstract deadline = Oct 20, 2007
 
  | Abstract deadline = Oct 20, 2007
 
  | Submission deadline = Jan 12, 2008
 
  | Submission deadline = Jan 12, 2008
 
  | Notification =  
 
  | Notification =  
  | Camera ready =
+
  | Camera ready =  
| Acronym= SEMI-THERM 2008
+
|wikicfpId=1429}}
| End date= 2008/03/20
 
| Series=
 
| Type  = Conference
 
| Country= US
 
| State = US/CA
 
| City  = US/CA/San Jose
 
| Homepage= www.semi-therm.org
 
| Start date= 2008/03/16
 
| Title = IEEE/CPMT 24th Semiconductor Thermal Measurement, Modeling & Management Symposium
 
| wikicfpId= 1429}}
 
  
 
<pre>
 
<pre>
 
The abstract should be between 2 and 5 pages of single spaced text giving the key results, findings and conclusions, supported by additional pages of figures tables and references as appropriate. Abstracts must demonstrate that proposed papers are appropriate for SEMI-THERM and of high technical quality.
 
The abstract should be between 2 and 5 pages of single spaced text giving the key results, findings and conclusions, supported by additional pages of figures tables and references as appropriate. Abstracts must demonstrate that proposed papers are appropriate for SEMI-THERM and of high technical quality.
 
</pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1429&amp;copyownerid=2 WikiCFP]
 
</pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1429&amp;copyownerid=2 WikiCFP]

Revision as of 00:26, 25 October 2021


Event Rating

median worst
Pain3.svg Pain7.svg

List of all ratings can be found at SEMI-THERM 2008/rating

SEMI-THERM 2008
IEEE/CPMT 24th Semiconductor Thermal Measurement, Modeling & Management Symposium
Dates Mar 16, 2008 (iCal) - Mar 20, 2008
Homepage: www.semi-therm.org
Location
Location: San Jose, CA, USA
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Important dates
Abstracts: Oct 20, 2007
Submissions: Jan 12, 2008
Table of Contents


The abstract should be between 2 and 5 pages of single spaced text giving the key results, findings and conclusions, supported by additional pages of figures tables and references as appropriate. Abstracts must demonstrate that proposed papers are appropriate for SEMI-THERM and of high technical quality.
	

This CfP was obtained from WikiCFP