Difference between revisions of "ICMTS 2019"
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(modified through wikirestore by orapi) |
(modified through wikirestore by orapi) |
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|ISBN=978-1-7281-1466-8 | |ISBN=978-1-7281-1466-8 | ||
|Acronym=ICMTS 2019 | |Acronym=ICMTS 2019 | ||
− | |End date=2019 | + | |End date=2019-03-21 |
|Series=ICMTS | |Series=ICMTS | ||
|presence=presence | |presence=presence | ||
Line 12: | Line 12: | ||
|State=JP/40 | |State=JP/40 | ||
|City =JP/40/Kitakyūshū | |City =JP/40/Kitakyūshū | ||
+ | |Year =2019 | ||
|Ordinal=32 | |Ordinal=32 | ||
− | |Start date=2019 | + | |Start date=2019-03-18 |
|Title=32nd IEEE International Conference on Microelectronic Test Structures | |Title=32nd IEEE International Conference on Microelectronic Test Structures | ||
|Accepted papers=38}} | |Accepted papers=38}} |
Revision as of 03:23, 19 November 2021
Event Rating
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List of all ratings can be found at ICMTS 2019/rating
ICMTS 2019 | |
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32nd IEEE International Conference on Microelectronic Test Structures
| |
Ordinal | 32 |
Event in series | ICMTS |
Dates | 2019-03-18 (iCal) - 2019-03-21 |
Presence | presence |
Location | |
Location: | JP/40/Kitakyūshū, JP/40, JP |
Table of Contents | |