Difference between revisions of "SEMI-THERM 2008"
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| Acronym= SEMI-THERM 2008 | | Acronym= SEMI-THERM 2008 | ||
− | | End date= 2008 | + | | End date= 2008-03-20 |
| Series= | | Series= | ||
| Type = Conference | | Type = Conference | ||
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| State = US/CA | | State = US/CA | ||
| City = US/CA/San Jose | | City = US/CA/San Jose | ||
+ | | Year = 2008 | ||
| Homepage= www.semi-therm.org | | Homepage= www.semi-therm.org | ||
− | | Start date= 2008 | + | | Start date= 2008-03-16 |
| Title = IEEE/CPMT 24th Semiconductor Thermal Measurement, Modeling & Management Symposium | | Title = IEEE/CPMT 24th Semiconductor Thermal Measurement, Modeling & Management Symposium | ||
| wikicfpId= 1429}} | | wikicfpId= 1429}} |
Revision as of 03:25, 19 November 2021
Event Rating
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List of all ratings can be found at SEMI-THERM 2008/rating
SEMI-THERM 2008 | |
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IEEE/CPMT 24th Semiconductor Thermal Measurement, Modeling & Management Symposium
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Dates | 2008-03-16 (iCal) - 2008-03-20 |
Homepage: | www.semi-therm.org |
Location | |
Location: | US/CA/San Jose, US/CA, US |
Important dates | |
Abstracts: | Oct 20, 2007 |
Submissions: | Jan 12, 2008 |
Table of Contents | |
The abstract should be between 2 and 5 pages of single spaced text giving the key results, findings and conclusions, supported by additional pages of figures tables and references as appropriate. Abstracts must demonstrate that proposed papers are appropriate for SEMI-THERM and of high technical quality.
This CfP was obtained from WikiCFP