Difference between revisions of "ICMTS 2008"

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(modified through wikirestore by orapi)
(modified through wikirestore by orapi)
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|Abstract deadline=2007/09/14
 
|Abstract deadline=2007/09/14
 
|Acronym =ICMTS 2008
 
|Acronym =ICMTS 2008
|End date=2008/03/27
+
|End date=2008-03-27
 
|Series  =ICMTS
 
|Series  =ICMTS
 
|presence=presence
 
|presence=presence
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|State  =GB/SCT
 
|State  =GB/SCT
 
|City    =GB/SCT/Edinburgh
 
|City    =GB/SCT/Edinburgh
 +
|Year    =2008
 
|Homepage=www.ee.ed.ac.uk/ICMTS
 
|Homepage=www.ee.ed.ac.uk/ICMTS
|Start date=2008/03/24
+
|Start date=2008-03-24
 
|Title  =IEEE International Conference on Microelectronic Test Structures
 
|Title  =IEEE International Conference on Microelectronic Test Structures
 
|wikicfpId=1448}}
 
|wikicfpId=1448}}
 
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1448&amp;copyownerid=2 WikiCFP]
 
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1448&amp;copyownerid=2 WikiCFP]

Revision as of 03:59, 19 November 2021


Event Rating

median worst
Pain2.svg Pain5.svg

List of all ratings can be found at ICMTS 2008/rating

ICMTS 2008
IEEE International Conference on Microelectronic Test Structures
Event in series ICMTS
Dates 2008-03-24 (iCal) - 2008-03-27
Presence presence
Homepage: www.ee.ed.ac.uk/ICMTS
Location
Location: GB/SCT/Edinburgh, GB/SCT, GB
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Important dates
Abstracts: 2007/09/14
Submissions: 2008/01/07
Table of Contents

This CfP was obtained from WikiCFP