Difference between revisions of "ICMTS 2009"

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(modified through wikirestore by orapi)
(modified through wikirestore by orapi)
 
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|Start date=2009-03-30
 
|Start date=2009-03-30
 
|Title=IEEE International Conference on Microelectronic Test Structures
 
|Title=IEEE International Conference on Microelectronic Test Structures
|wikicfpId=2859}}
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|wikicfpId=2859
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<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2859&amp;copyownerid=2 WikiCFP]
 
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2859&amp;copyownerid=2 WikiCFP]

Latest revision as of 03:35, 6 December 2021


Event Rating

median worst
Pain1.svg Pain5.svg

List of all ratings can be found at ICMTS 2009/rating

ICMTS 2009
IEEE International Conference on Microelectronic Test Structures
Event in series ICMTS
Dates 2009-03-30 (iCal) - 2009-04-02
Presence presence
Homepage: www.see.ed.ac.uk/ICMTS
Location
Location: US/CA/Oxnard, US/CA, US
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Important dates
Submissions: 2008/09/15
Table of Contents

This CfP was obtained from WikiCFP