Difference between revisions of "ICTD 2008"

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  | Acronym= ICTD 2008
 
  | Acronym= ICTD 2008
  | End date= 2008/10/26
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  | End date= 2008-10-26
 
  | Series=
 
  | Series=
 
  | Type  = Conference
 
  | Type  = Conference
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  | State = CN/SC
 
  | State = CN/SC
 
  | City  = CN/SC/Chengdu
 
  | City  = CN/SC/Chengdu
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| Year  = 2008
 
  | Homepage= ictd08.uestc.edu.cn/index.php?show=call4paper
 
  | Homepage= ictd08.uestc.edu.cn/index.php?show=call4paper
  | Start date= 2008/10/25
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  | Start date= 2008-10-25
 
  | Title = IEEE Circuits and Systems International Conference on Testing and Diagnosis
 
  | Title = IEEE Circuits and Systems International Conference on Testing and Diagnosis
  | wikicfpId= 2973}}
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  | wikicfpId= 2973
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}}
  
 
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2973&amp;copyownerid=2 WikiCFP]
 
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2973&amp;copyownerid=2 WikiCFP]

Latest revision as of 03:53, 6 December 2021


Event Rating

median worst
Pain2.svg Pain7.svg

List of all ratings can be found at ICTD 2008/rating

ICTD 2008
IEEE Circuits and Systems International Conference on Testing and Diagnosis
Dates 2008-10-25 (iCal) - 2008-10-26
Homepage: ictd08.uestc.edu.cn/index.php?show=call4paper
Location
Location: CN/SC/Chengdu, CN/SC, CN
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Important dates
Submissions: Jun 15, 2008
Table of Contents


This CfP was obtained from WikiCFP