Difference between revisions of "ICTD 2008"

From OPENRESEARCH fixed Wiki
Jump to navigation Jump to search
(modified through wikirestore by orapi)
(modified through wikirestore by orapi)
 
Line 16: Line 16:
 
  | Start date= 2008-10-25
 
  | Start date= 2008-10-25
 
  | Title = IEEE Circuits and Systems International Conference on Testing and Diagnosis
 
  | Title = IEEE Circuits and Systems International Conference on Testing and Diagnosis
  | wikicfpId= 2973}}
+
  | wikicfpId= 2973
 +
}}
  
 
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2973&amp;copyownerid=2 WikiCFP]
 
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2973&amp;copyownerid=2 WikiCFP]

Latest revision as of 03:53, 6 December 2021


Event Rating

median worst
Pain2.svg Pain7.svg

List of all ratings can be found at ICTD 2008/rating

ICTD 2008
IEEE Circuits and Systems International Conference on Testing and Diagnosis
Dates 2008-10-25 (iCal) - 2008-10-26
Homepage: ictd08.uestc.edu.cn/index.php?show=call4paper
Location
Location: CN/SC/Chengdu, CN/SC, CN
Loading map...

Important dates
Submissions: Jun 15, 2008
Table of Contents


This CfP was obtained from WikiCFP