Difference between revisions of "ICMTS 2019"

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(modified through wikirestore by orapi)
(modified through wikirestore by orapi)
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|Start date=2019-03-18
 
|Start date=2019-03-18
 
|Title=32nd IEEE International Conference on Microelectronic Test Structures
 
|Title=32nd IEEE International Conference on Microelectronic Test Structures
|Accepted papers=38}}
+
|Accepted papers=38
 +
}}

Revision as of 03:59, 6 December 2021


Event Rating

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List of all ratings can be found at ICMTS 2019/rating

ICMTS 2019
32nd IEEE International Conference on Microelectronic Test Structures
Ordinal 32
Event in series ICMTS
Dates 2019-03-18 (iCal) - 2019-03-21
Presence presence
Location
Location: JP/40/Kitakyūshū, JP/40, JP
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