Difference between revisions of "ICMTS 2022"

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|Twitter account=@IEEE_ICMTS
 
|Twitter account=@IEEE_ICMTS
 
|Acronym=ICMTS 2022
 
|Acronym=ICMTS 2022
|End date=2022/03/24
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|End date=2022-03-24
 
|Series=ICMTS
 
|Series=ICMTS
 
|presence=presence
 
|presence=presence
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|State=US/OH
 
|State=US/OH
 
|City =US/OH/Cleveland
 
|City =US/OH/Cleveland
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|Year =2022
 
|Homepage=http://icmts.if.t.u-tokyo.ac.jp
 
|Homepage=http://icmts.if.t.u-tokyo.ac.jp
 
|Ordinal=34
 
|Ordinal=34
|Start date=2022/03/21
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|Start date=2022-03-21
 
|Title=IEEE International Conference on Microelectronic Test Structures
 
|Title=IEEE International Conference on Microelectronic Test Structures
 
}}
 
}}

Latest revision as of 04:13, 6 December 2021


Event Rating

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List of all ratings can be found at ICMTS 2022/rating

ICMTS 2022
IEEE International Conference on Microelectronic Test Structures
Ordinal 34
Event in series ICMTS
Dates 2022-03-21 (iCal) - 2022-03-24
Presence presence
Homepage: http://icmts.if.t.u-tokyo.ac.jp
Twitter account: @IEEE_ICMTS
Location
Location: US/OH/Cleveland, US/OH, US
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Important dates
Submissions: 2021/10/29
Table of Contents
Tweets by @IEEE_ICMTS| colspan="2" style="padding-top: 2px; " |