Difference between revisions of "ICMTS 2018"

Event Rating

median	worst

List of all ratings can be found at ICMTS 2018/rating

ICMTS 2018
IEEE International Conference on Microelectronic Test Structures
Ordinal	31
Event in series	ICMTS
Dates	2018-03-19 (iCal) - 2018-03-22
Presence	presence
Location
Location:	US/TX/Austin, US/TX, US
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AcronymThis property is of the datatype Text and it is being used to provide the acronym of an academic event or an event series.It is a recommended property when describing an academic event or event series and it is not needed for the DOI registration process via DataCite.

ICMTS 2018 +

End dateThis property is of the datatype Date and it is being used to provide the end date of an academic event or a project.This property is aligned with icaltzd:dtend.It is a mandatory property when describing an academic event and it is needed for the DOI registration process via DataCite.

March 22, 2018 +

Event in seriesThe property Event in series, of the datatype Page, is used to state that an academic event is part of a specific academic event series. Although this property is not needed for the DOI registration process via DataCite its usage is strongly recommended.

ICMTS +

Event presence

presence +

Event typeThis property of the datatype Text is used to specify the format of an academic event. The use of this property is recommended. It is necessary for the DOI registration process via DataCite.

Conference +

GND-IDThis property of the datatype External identifier is used to provide the identifier with which an entity is indexed in the Integrated_Authority_File (GND). Its external formatter URI is http://d-nb.info/gnd/$1.In Open Research it is mostly used to identify an academic event or event series within the GND. The use of this property is optional.It is not necessary for the DOI registration process via DataCite.

1169681158 +

Has location cityThe property Has location city can be used to specify the city where a street, building, event, etc. is located in.It is of the datatype Page and a special case of the Property:Located in. Other properties for specifying locations are: property:Has location country, property:Has location state and property:Has location address.When specifying the city in which an academic event takes or took place, using this property is not needed for the DOI registration process via DataCite but strongly recommended.

Austin +

Has location countryThe property Has location country is used to describe the country where something is located in.It is of the datatype Page and a special case of the Property:Located in. Other properties for specifying locations are: property:Has location city, property:Has location state and property:Has location address.When specifying the country in which an academic event takes or took place, using this property is not needed for the DOI registration process via DataCite but strongly recommended.

USA +

Has year

2018 +

IsA

Event +

OrdinalThis property of the datatype Number represents the ordinal number of an event within an event series. Thereby it informs about the age of an event series. This property is not needed for the DOI registration process via DataCite and is optional.

31 +

Start dateThis property is of the datatype Date and it is being used to provide the start date of an academic event or a project.This property is aligned with icaltzd:dtstart. It is a mandatory property when describing an academic event and it is needed for the DOI registration process via DataCite.

March 19, 2018 +

@@ Line 1: / Line 1: @@
 {{Event
-|Acronym=ICMTS 2018
-|Title=IEEE International Conference on Microelectronic Test Structures
-|Ordinal=31
-|Series=ICMTS
-|Type=Conference
 |Field=Uncategorized
-|Start date=2018/03/19
-|End date=2018/03/22
 |gndId=1169681158
-|City=Austin
-|State=Texas
-|Country=USA
-|presence=presence
 |has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243
 |has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243
-|ISBN=978-1-5386-5069-1
+|Acronym=ICMTS 2018
+|End date=2018-03-22
+|Series=ICMTS
+|presence=presence
+|Type =Conference
+|Country=US
+|State=US/TX
+|City =US/TX/Austin
+|Year =2018
+|Ordinal=31
+|Start date=2018-03-19
+|Title=IEEE International Conference on Microelectronic Test Structures
+|ISBN =978-1-5386-5069-1
 }}

Difference between revisions of "ICMTS 2018"

Latest revision as of 02:55, 7 December 2021

Event Rating

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