Difference between revisions of "ICMTS 2018"
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|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | |has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | ||
|has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | |has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | ||
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|Acronym=ICMTS 2018 | |Acronym=ICMTS 2018 | ||
|End date=2018-03-22 | |End date=2018-03-22 | ||
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|Ordinal=31 | |Ordinal=31 | ||
|Start date=2018-03-19 | |Start date=2018-03-19 | ||
| − | |Title=IEEE International Conference on Microelectronic Test Structures}} | + | |Title=IEEE International Conference on Microelectronic Test Structures |
| + | |ISBN =978-1-5386-5069-1 | ||
| + | }} | ||
Latest revision as of 01:55, 7 December 2021
Event Rating
| median | worst |
|---|---|
List of all ratings can be found at ICMTS 2018/rating
| ICMTS 2018 | |
|---|---|
IEEE International Conference on Microelectronic Test Structures
| |
| Ordinal | 31 |
| Event in series | ICMTS |
| Dates | 2018-03-19 (iCal) - 2018-03-22 |
| Presence | presence |
| Location | |
| Location: | US/TX/Austin, US/TX, US |
| Table of Contents | |