Difference between revisions of "ICMTS 2022"
Jump to navigation
Jump to search
(modified through wikirestore by orapi) |
(modified through wikirestore by orapi) |
||
| Line 15: | Line 15: | ||
|Ordinal=34 | |Ordinal=34 | ||
|Start date=2022-03-21 | |Start date=2022-03-21 | ||
| − | |Title=IEEE International Conference on Microelectronic Test Structures}} | + | |Title=IEEE International Conference on Microelectronic Test Structures |
| + | }} | ||
Latest revision as of 04:13, 6 December 2021
Event Rating
| median | worst |
|---|---|
List of all ratings can be found at ICMTS 2022/rating
| ICMTS 2022 | |
|---|---|
IEEE International Conference on Microelectronic Test Structures
| |
| Ordinal | 34 |
| Event in series | ICMTS |
| Dates | 2022-03-21 (iCal) - 2022-03-24 |
| Presence | presence |
| Homepage: | http://icmts.if.t.u-tokyo.ac.jp |
| Twitter account: | @IEEE_ICMTS |
| Location | |
| Location: | US/OH/Cleveland, US/OH, US |
| Important dates | |
| Submissions: | 2021/10/29 |
| Table of Contents | |
| Tweets by @IEEE_ICMTS| colspan="2" style="padding-top: 2px; " | | |