Difference between revisions of "ICMTS 2018"
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|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | |has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | ||
|has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | |has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | ||
− | |||
|Acronym=ICMTS 2018 | |Acronym=ICMTS 2018 | ||
− | |End date=2018 | + | |End date=2018-03-22 |
|Series=ICMTS | |Series=ICMTS | ||
|presence=presence | |presence=presence | ||
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|State=US/TX | |State=US/TX | ||
|City =US/TX/Austin | |City =US/TX/Austin | ||
+ | |Year =2018 | ||
|Ordinal=31 | |Ordinal=31 | ||
− | |Start date=2018 | + | |Start date=2018-03-19 |
|Title=IEEE International Conference on Microelectronic Test Structures | |Title=IEEE International Conference on Microelectronic Test Structures | ||
+ | |ISBN =978-1-5386-5069-1 | ||
}} | }} |
Latest revision as of 02:55, 7 December 2021
Event Rating
median | worst |
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List of all ratings can be found at ICMTS 2018/rating
ICMTS 2018 | |
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IEEE International Conference on Microelectronic Test Structures
| |
Ordinal | 31 |
Event in series | ICMTS |
Dates | 2018-03-19 (iCal) - 2018-03-22 |
Presence | presence |
Location | |
Location: | US/TX/Austin, US/TX, US |
Table of Contents | |