Difference between revisions of "ICMTS 2018"

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|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243
 
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243
 
|has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243
 
|has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243
|ISBN=978-1-5386-5069-1
 
 
|Acronym=ICMTS 2018
 
|Acronym=ICMTS 2018
|End date=2018/03/22
+
|End date=2018-03-22
 
|Series=ICMTS
 
|Series=ICMTS
 
|presence=presence
 
|presence=presence
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|State=US/TX
 
|State=US/TX
 
|City =US/TX/Austin
 
|City =US/TX/Austin
 +
|Year =2018
 
|Ordinal=31
 
|Ordinal=31
|Start date=2018/03/19
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|Start date=2018-03-19
 
|Title=IEEE International Conference on Microelectronic Test Structures
 
|Title=IEEE International Conference on Microelectronic Test Structures
 +
|ISBN =978-1-5386-5069-1
 
}}
 
}}

Latest revision as of 02:55, 7 December 2021


Event Rating

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List of all ratings can be found at ICMTS 2018/rating

ICMTS 2018
IEEE International Conference on Microelectronic Test Structures
Ordinal 31
Event in series ICMTS
Dates 2018-03-19 (iCal) - 2018-03-22
Presence presence
Location
Location: US/TX/Austin, US/TX, US
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