Difference between revisions of "ICMTS 2022"

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{{Event
 
{{Event
 +
|Acronym=ICMTS 2022
 +
|Title=IEEE International Conference on Microelectronic Test Structures
 +
|Ordinal=34
 +
|Series=ICMTS
 +
|Type=Conference
 
|Field=Uncategorized
 
|Field=Uncategorized
 +
|Start date=2022/03/21
 +
|End date=2022/03/24
 
|Submission deadline=2021/10/29
 
|Submission deadline=2021/10/29
 +
|Homepage=http://icmts.if.t.u-tokyo.ac.jp
 
|Twitter account=@IEEE_ICMTS
 
|Twitter account=@IEEE_ICMTS
|Acronym=ICMTS 2022
+
|City=Cleveland
|End date=2022/03/24
+
|State=Ohio
|Series=ICMTS
+
|Country=USA
 
|presence=presence
 
|presence=presence
|Type =Conference
 
|Country=US
 
|State=US/OH
 
|City =US/OH/Cleveland
 
|Homepage=http://icmts.if.t.u-tokyo.ac.jp
 
|Ordinal=34
 
|Start date=2022/03/21
 
|Title=IEEE International Conference on Microelectronic Test Structures
 
 
}}
 
}}

Revision as of 16:27, 3 November 2021


Event Rating

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List of all ratings can be found at ICMTS 2022/rating

ICMTS 2022
IEEE International Conference on Microelectronic Test Structures
Ordinal 34
Event in series ICMTS
Dates 2022/03/21 (iCal) - 2022/03/24
Presence presence
Homepage: http://icmts.if.t.u-tokyo.ac.jp
Twitter account: @IEEE_ICMTS
Location
Location: Cleveland, Ohio, USA
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Important dates
Submissions: 2021/10/29
Table of Contents
Tweets by @IEEE_ICMTS| colspan="2" style="padding-top: 2px; " |