Difference between revisions of "ICMTS 2020"
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(modified through wikirestore by orapi) |
(modified through wikirestore by orapi) |
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|ISBN=978-1-7281-4008-7 | |ISBN=978-1-7281-4008-7 | ||
|Acronym=ICMTS 2020 | |Acronym=ICMTS 2020 | ||
− | |End date=2020 | + | |End date=2020-03-18 |
|Series=ICMTS | |Series=ICMTS | ||
|presence=online | |presence=online | ||
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|State=GB/SCT | |State=GB/SCT | ||
|City =GB/SCT/Edinburgh | |City =GB/SCT/Edinburgh | ||
+ | |Year =2020 | ||
|Homepage=https://www.eng.ed.ac.uk/ | |Homepage=https://www.eng.ed.ac.uk/ | ||
|Ordinal=33 | |Ordinal=33 | ||
− | |Start date=2020 | + | |Start date=2020-03-04 |
|Title=33rd IEEE International Conference on Microelectronic Test Structures}} | |Title=33rd IEEE International Conference on Microelectronic Test Structures}} |
Revision as of 03:17, 19 November 2021
Event Rating
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List of all ratings can be found at ICMTS 2020/rating
ICMTS 2020 | |
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33rd IEEE International Conference on Microelectronic Test Structures
| |
Ordinal | 33 |
Event in series | ICMTS |
Dates | 2020-03-04 (iCal) - 2020-03-18 |
Presence | online |
Homepage: | https://www.eng.ed.ac.uk/ |
Location | |
Location: | GB/SCT/Edinburgh, GB/SCT, GB |
Important dates | |
Submissions: | 2021/10/29 |
Table of Contents | |