Difference between revisions of "MTDT 2007"
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| Start date= 2007-12-03 | | Start date= 2007-12-03 | ||
| Title = IEEE International Workshop on Memory Technology, Design and Testing | | Title = IEEE International Workshop on Memory Technology, Design and Testing | ||
| − | | wikicfpId= 1368}} | + | | wikicfpId= 1368 |
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<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1368&copyownerid=2 WikiCFP] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1368&copyownerid=2 WikiCFP] | ||
Latest revision as of 03:05, 6 December 2021
Event Rating
| median | worst |
|---|---|
List of all ratings can be found at MTDT 2007/rating
| MTDT 2007 | |
|---|---|
IEEE International Workshop on Memory Technology, Design and Testing
| |
| Dates | 2007-12-03 (iCal) - 2007-12-05 |
| Homepage: | www.ieee-mtdt.org |
| Location | |
| Location: | TW/TPE/Taipei, TW/TPE, TW |
| Important dates | |
| Abstracts: | Sep 15, 2007 |
| Submissions: | Oct 15, 2007 |
| Table of Contents | |
This CfP was obtained from WikiCFP