Difference between revisions of "ICMTS 2020"
Jump to navigation
Jump to search
(modified through wikirestore by Th) |
(modified through wikirestore by Th) |
||
| Line 1: | Line 1: | ||
{{Event | {{Event | ||
| + | |Acronym=ICMTS 2020 | ||
| + | |Title=33rd IEEE International Conference on Microelectronic Test Structures | ||
| + | |Ordinal=33 | ||
| + | |Series=ICMTS | ||
| + | |Type=Conference | ||
|Field=Uncategorized | |Field=Uncategorized | ||
| + | |Start date=2020/03/04 | ||
| + | |End date=2020/03/18 | ||
|Submission deadline=2021/10/29 | |Submission deadline=2021/10/29 | ||
| + | |Homepage=https://www.eng.ed.ac.uk/ | ||
|gndId=1217717676 | |gndId=1217717676 | ||
| + | |City=Edinburgh | ||
| + | |Country=Online | ||
| + | |presence=online | ||
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=9104792 | |has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=9104792 | ||
|ISBN=978-1-7281-4008-7 | |ISBN=978-1-7281-4008-7 | ||
| − | + | |State=GB/SCT}} | |
| − | |||
| − | |||
| − | |||
| − | |||
| − | |||
| − | |State=GB/SCT | ||
| − | |||
| − | |||
| − | |||
| − | |||
| − | |||
Revision as of 00:15, 25 October 2021
Event Rating
| median | worst |
|---|---|
List of all ratings can be found at ICMTS 2020/rating
| ICMTS 2020 | |
|---|---|
33rd IEEE International Conference on Microelectronic Test Structures
| |
| Ordinal | 33 |
| Event in series | ICMTS |
| Dates | 2020/03/04 (iCal) - 2020/03/18 |
| Presence | online |
| Homepage: | https://www.eng.ed.ac.uk/ |
| Location | |
| Location: | Edinburgh, GB/SCT, Online |
| Important dates | |
| Submissions: | 2021/10/29 |
| Table of Contents | |