Difference between revisions of "ICTD 2008"

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Event Rating

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ICTD 2008
IEEE Circuits and Systems International Conference on Testing and Diagnosis
Dates	2008/10/25 (iCal) - 2008/10/26
Homepage:	ictd08.uestc.edu.cn/index.php?show=call4paper
Location
Location:	CN/SC/Chengdu, CN/SC, CN
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Important dates
Submissions:	Jun 15, 2008

Table of Contents
Contents 1 Event Rating

This CfP was obtained from WikiCFP

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AcronymThis property is of the datatype Text and it is being used to provide the acronym of an academic event or an event series.It is a recommended property when describing an academic event or event series and it is not needed for the DOI registration process via DataCite.

ICTD 2008 +

End dateThis property is of the datatype Date and it is being used to provide the end date of an academic event or a project.This property is aligned with icaltzd:dtend.It is a mandatory property when describing an academic event and it is needed for the DOI registration process via DataCite.

October 26, 2008 +

Event typeThis property of the datatype Text is used to specify the format of an academic event. The use of this property is recommended. It is necessary for the DOI registration process via DataCite.

Conference +

Has location cityThe property Has location city can be used to specify the city where a street, building, event, etc. is located in.It is of the datatype Page and a special case of the Property:Located in. Other properties for specifying locations are: property:Has location country, property:Has location state and property:Has location address.When specifying the city in which an academic event takes or took place, using this property is not needed for the DOI registration process via DataCite but strongly recommended.

CN/SC/Chengdu +

Has location countryThe property Has location country is used to describe the country where something is located in.It is of the datatype Page and a special case of the Property:Located in. Other properties for specifying locations are: property:Has location city, property:Has location state and property:Has location address.When specifying the country in which an academic event takes or took place, using this property is not needed for the DOI registration process via DataCite but strongly recommended.

CN +

Has year

2008 +

HomepageThis property is of the datatype URL and it is being used to provide the official website of an academic event or an event series.It is a recommended property when describing an academic event or event series and it is not needed for the DOI registration process via DataCite.

http://ictd08.uestc.edu.cn/index.php?show=call4paper +

IsA

Event +

Start dateThis property is of the datatype Date and it is being used to provide the start date of an academic event or a project.This property is aligned with icaltzd:dtstart. It is a mandatory property when describing an academic event and it is needed for the DOI registration process via DataCite.

October 25, 2008 +

WikiCFP-IDThis property of the datatype External identifier is used to provide the identifier with which an entity is indexed in WikiCFP. Its external formatter URI is http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=$1.In Open Research it is used to identify an academic event or event series within WikiCFP. The use of this property is optional. It is not necessary for the DOI registration process via DataCite.

2973 +

@@ Line 1: / Line 1: @@
 {{Event
- | Acronym = ICTD 2008
- | Title = IEEE Circuits and Systems International Conference on Testing and Diagnosis
- | Type = Conference
- | Series =
   | Field = Computer architecture
- | Homepage = ictd08.uestc.edu.cn/index.php?show=call4paper
- | Start date = Oct 25, 2008
- | End date =  Oct 26, 2008
- | City= Chengdu
- | State =  Sichuan
- | Country =  China
   | Abstract deadline =
   | Submission deadline = Jun 15, 2008
   | Notification =
   | Camera ready =
-|wikicfpId=2973}}
+ | Acronym= ICTD 2008
+ | End date= 2008/10/26
+ | Series=
+ | Type  = Conference
+ | Country= CN
+ | State = CN/SC
+ | City  = CN/SC/Chengdu
+ | Homepage= ictd08.uestc.edu.cn/index.php?show=call4paper
+ | Start date= 2008/10/25
+ | Title = IEEE Circuits and Systems International Conference on Testing and Diagnosis
+ | wikicfpId= 2973}}
 <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2973&amp;copyownerid=2 WikiCFP]

Difference between revisions of "ICTD 2008"

Revision as of 01:50, 25 October 2021

Event Rating

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