Difference between revisions of "ICMTS 2009"

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(modified through wikirestore by orapi)
(modified through wikirestore by orapi)
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|Submission deadline=2008/09/15
 
|Submission deadline=2008/09/15
 
|Acronym=ICMTS 2009
 
|Acronym=ICMTS 2009
|End date=2009/04/02
+
|End date=2009-04-02
 
|Series=ICMTS
 
|Series=ICMTS
 
|presence=presence
 
|presence=presence
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|State=US/CA
 
|State=US/CA
 
|City =US/CA/Oxnard
 
|City =US/CA/Oxnard
 +
|Year =2009
 
|Homepage=www.see.ed.ac.uk/ICMTS
 
|Homepage=www.see.ed.ac.uk/ICMTS
|Start date=2009/03/30
+
|Start date=2009-03-30
 
|Title=IEEE International Conference on Microelectronic Test Structures
 
|Title=IEEE International Conference on Microelectronic Test Structures
 
|wikicfpId=2859}}
 
|wikicfpId=2859}}
 
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2859&amp;copyownerid=2 WikiCFP]
 
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2859&amp;copyownerid=2 WikiCFP]

Revision as of 02:58, 19 November 2021


Event Rating

median worst
Pain1.svg Pain5.svg

List of all ratings can be found at ICMTS 2009/rating

ICMTS 2009
IEEE International Conference on Microelectronic Test Structures
Event in series ICMTS
Dates 2009-03-30 (iCal) - 2009-04-02
Presence presence
Homepage: www.see.ed.ac.uk/ICMTS
Location
Location: US/CA/Oxnard, US/CA, US
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Important dates
Submissions: 2008/09/15
Table of Contents

This CfP was obtained from WikiCFP