Difference between revisions of "ICMTS 2018"

From OPENRESEARCH fixed Wiki
Jump to navigation Jump to search
(modified through wikirestore by orapi)
(modified through wikirestore by orapi)
Line 6: Line 6:
 
|ISBN=978-1-5386-5069-1
 
|ISBN=978-1-5386-5069-1
 
|Acronym=ICMTS 2018
 
|Acronym=ICMTS 2018
|End date=2018/03/22
+
|End date=2018-03-22
 
|Series=ICMTS
 
|Series=ICMTS
 
|presence=presence
 
|presence=presence
Line 13: Line 13:
 
|State=US/TX
 
|State=US/TX
 
|City =US/TX/Austin
 
|City =US/TX/Austin
 +
|Year =2018
 
|Ordinal=31
 
|Ordinal=31
|Start date=2018/03/19
+
|Start date=2018-03-19
|Title=IEEE International Conference on Microelectronic Test Structures
+
|Title=IEEE International Conference on Microelectronic Test Structures}}
}}
 

Revision as of 03:02, 19 November 2021


Event Rating

median worst
Pain1.svg Pain5.svg

List of all ratings can be found at ICMTS 2018/rating

ICMTS 2018
IEEE International Conference on Microelectronic Test Structures
Ordinal 31
Event in series ICMTS
Dates 2018-03-19 (iCal) - 2018-03-22
Presence presence
Location
Location: US/TX/Austin, US/TX, US
Loading map...

Table of Contents