Difference between revisions of "ICMTS 2009"
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|Start date=2009-03-30 | |Start date=2009-03-30 | ||
|Title=IEEE International Conference on Microelectronic Test Structures | |Title=IEEE International Conference on Microelectronic Test Structures | ||
| − | |wikicfpId=2859}} | + | |wikicfpId=2859 |
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<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2859&copyownerid=2 WikiCFP] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2859&copyownerid=2 WikiCFP] | ||
Latest revision as of 02:35, 6 December 2021
Event Rating
| median | worst |
|---|---|
List of all ratings can be found at ICMTS 2009/rating
| ICMTS 2009 | |
|---|---|
IEEE International Conference on Microelectronic Test Structures
| |
| Event in series | ICMTS |
| Dates | 2009-03-30 (iCal) - 2009-04-02 |
| Presence | presence |
| Homepage: | www.see.ed.ac.uk/ICMTS |
| Location | |
| Location: | US/CA/Oxnard, US/CA, US |
| Important dates | |
| Submissions: | 2008/09/15 |
| Table of Contents | |
This CfP was obtained from WikiCFP