Difference between revisions of "ICMTS 2008"

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|Start date=2008-03-24
 
|Start date=2008-03-24
 
|Title  =IEEE International Conference on Microelectronic Test Structures
 
|Title  =IEEE International Conference on Microelectronic Test Structures
|wikicfpId=1448}}
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|wikicfpId=1448
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<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1448&amp;copyownerid=2 WikiCFP]
 
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1448&amp;copyownerid=2 WikiCFP]

Latest revision as of 04:34, 6 December 2021


Event Rating

median worst
Pain2.svg Pain5.svg

List of all ratings can be found at ICMTS 2008/rating

ICMTS 2008
IEEE International Conference on Microelectronic Test Structures
Event in series ICMTS
Dates 2008-03-24 (iCal) - 2008-03-27
Presence presence
Homepage: www.ee.ed.ac.uk/ICMTS
Location
Location: GB/SCT/Edinburgh, GB/SCT, GB
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Important dates
Abstracts: 2007/09/14
Submissions: 2008/01/07
Table of Contents

This CfP was obtained from WikiCFP