Event Rating
median
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worst
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List of all ratings can be found at ICMTS 2020/rating
ICMTS 2020
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33rd IEEE International Conference on Microelectronic Test Structures
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Ordinal
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33
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Event in series
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ICMTS
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Dates
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2020-03-04 (iCal) - 2020-03-18
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Presence
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online
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Homepage:
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https://www.eng.ed.ac.uk/
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Location
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Location:
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GB/SCT/Edinburgh, GB/SCT, GB
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Loading map... {"minzoom":false,"maxzoom":false,"mappingservice":"leaflet","width":"280px","height":"280px","centre":false,"title":"","label":"","icon":"","lines":[],"polygons":[],"circles":[],"rectangles":[],"copycoords":false,"static":false,"zoom":false,"defzoom":14,"layers":["OpenStreetMap"],"image layers":[],"overlays":[],"resizable":false,"fullscreen":false,"scrollwheelzoom":true,"cluster":false,"clustermaxzoom":20,"clusterzoomonclick":true,"clustermaxradius":80,"clusterspiderfy":true,"geojson":"","clicktarget":"","imageLayers":[],"locations":[{"text":"","title":"","link":"","lat":55.9533456,"lon":-3.1883749,"icon":""}],"imageoverlays":null}
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Important dates
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Submissions:
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2021/10/29
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Table of Contents
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